Harajuku Lovers

Applied Scanning Probe Methods VI: Characterization (NanoScience and Technol...

Description: Note: Any images shown are stock photographs and product may differ from what is shown. You are purchasing a Good copy of 'Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)'Condition Notes: Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can included some highlighting and writing, page and cover creases as well as other types visible wear.

Price: 5.63 USD

Location: San Jose, California

End Time: 2024-12-09T16:30:39.000Z

Shipping Cost: 0 USD

Product Images

Applied Scanning Probe Methods VI: Characterization (NanoScience and Technol...

Item Specifics

Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 30 Days

Refund will be given as: Money Back

Return policy details:

Release Year: 2006

Book Title: Applied Scanning Probe Methods VI: Characterization (NanoScien...

Number of Pages: Xlv, 338 Pages

Publication Name: Applied Scanning Probe Methods VI : Characterization

Language: English

Publisher: Springer Berlin / Heidelberg

Subject: Nanoscience, Materials Science / Thin Films, Surfaces & Interfaces, Electron Microscopes & Microscopy, Nanotechnology & Mems, Microscopes & Microscopy

Publication Year: 2006

Type: Textbook

Item Weight: 26.3 Oz

Item Length: 9.3 in

Subject Area: Technology & Engineering, Science

Author: Harald Fuchs

Item Width: 6.1 in

Series: Nanoscience and Technology Ser.

Format: Hardcover

Recommended

Applied Materials (AMAT) 0100-90273 PWB ASSY SPIN SCAN MOTHERBOARD
Applied Materials (AMAT) 0100-90273 PWB ASSY SPIN SCAN MOTHERBOARD

$2479.95

View Details
Applied Scanning Probe Methods VIII - 9783642093401
Applied Scanning Probe Methods VIII - 9783642093401

$99.58

View Details
APPLIED MATERIALS AMAT DRIVER ASSY FAST SCAN, 5PUG87-000606-11
APPLIED MATERIALS AMAT DRIVER ASSY FAST SCAN, 5PUG87-000606-11

$6000.00

View Details
6841  Applied Materials E16294160 Cable Assy, W3027, Beamline Post Scan HV
6841 Applied Materials E16294160 Cable Assy, W3027, Beamline Post Scan HV

$300.00

View Details
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques, H...
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques, H...

$155.51

View Details
AMAT Applied Materials 0100-90261 Spin Scan Detector PCB Card Working Surplus
AMAT Applied Materials 0100-90261 Spin Scan Detector PCB Card Working Surplus

$755.24

View Details
New Horizons of Applied Scanning Electron Microscopy by Kenichi Shimizu (English
New Horizons of Applied Scanning Electron Microscopy by Kenichi Shimizu (English

$125.44

View Details
21016400052 / SCAN ROTATION / APPLIED MATERIALS AMAT
21016400052 / SCAN ROTATION / APPLIED MATERIALS AMAT

$1370.13

View Details
Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques: New
Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques: New

$184.43

View Details
Applied Scanning Probe Methods II : Scanning Probe Microscopy Techniques, Har...
Applied Scanning Probe Methods II : Scanning Probe Microscopy Techniques, Har...

$189.55

View Details