Harajuku Lovers

Applied Scanning Probe Methods VI: Characterization (NanoScience and Technol...

Description: Note: Any images shown are stock photographs and product may differ from what is shown. You are purchasing a Good copy of 'Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)'Condition Notes: Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can included some highlighting and writing, page and cover creases as well as other types visible wear.

Price: 5.63 USD

Location: San Jose, California

End Time: 2024-12-09T16:30:39.000Z

Shipping Cost: 0 USD

Product Images

Applied Scanning Probe Methods VI: Characterization (NanoScience and Technol...

Item Specifics

Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 30 Days

Refund will be given as: Money Back

Return policy details:

Release Year: 2006

Book Title: Applied Scanning Probe Methods VI: Characterization (NanoScien...

Number of Pages: Xlv, 338 Pages

Publication Name: Applied Scanning Probe Methods VI : Characterization

Language: English

Publisher: Springer Berlin / Heidelberg

Subject: Nanoscience, Materials Science / Thin Films, Surfaces & Interfaces, Electron Microscopes & Microscopy, Nanotechnology & Mems, Microscopes & Microscopy

Publication Year: 2006

Type: Textbook

Item Weight: 26.3 Oz

Item Length: 9.3 in

Subject Area: Technology & Engineering, Science

Author: Harald Fuchs

Item Width: 6.1 in

Series: Nanoscience and Technology Ser.

Format: Hardcover

Recommended

Applied Scanning Probe Methods IX - 9783642093418
Applied Scanning Probe Methods IX - 9783642093418

$98.48

View Details
Applied Scanning Probe Methods VI: Characterization by Bharat Bhushan: Used
Applied Scanning Probe Methods VI: Characterization by Bharat Bhushan: Used

$12.46

View Details
AMAT Applied Materials 0100-90890 Spin/Scan Interlock PCB Card Working Surplus
AMAT Applied Materials 0100-90890 Spin/Scan Interlock PCB Card Working Surplus

$755.24

View Details
Applied Scanning Probe Methods VIII - 9783642093401
Applied Scanning Probe Methods VIII - 9783642093401

$99.58

View Details
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques, H...
Applied Scanning Probe Methods VIII : Scanning Probe Microscopy Techniques, H...

$155.51

View Details
Bhushan - Applied Scanning Probe Methods III  Characterization - New  - T9000z
Bhushan - Applied Scanning Probe Methods III Characterization - New - T9000z

$201.24

View Details
AMAT Applied Materials 0100-90771 Spin Scan Error PCB Card Working Surplus
AMAT Applied Materials 0100-90771 Spin Scan Error PCB Card Working Surplus

$755.24

View Details
21016400051 / SCAN MODE SWITCH BOARD / APPLIED MATERIALS AMAT
21016400051 / SCAN MODE SWITCH BOARD / APPLIED MATERIALS AMAT

$807.69

View Details
141-0701// AMAT APPLIED 0150-00174 SCANNING END POINT CABLE NEW
141-0701// AMAT APPLIED 0150-00174 SCANNING END POINT CABLE NEW

$160.00

View Details
Applied Scanning Probe Methods VI: Characterization (NanoScience and Technol...
Applied Scanning Probe Methods VI: Characterization (NanoScience and Technol...

$5.63

View Details