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Applied Scanning Probe Methods VI: Characterization (NanoScience and Technol...

Description: Note: Any images shown are stock photographs and product may differ from what is shown. You are purchasing a Good copy of 'Applied Scanning Probe Methods VI: Characterization (NanoScience and Technology)'Condition Notes: Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can included some highlighting and writing, page and cover creases as well as other types visible wear.

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Location: San Jose, California

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Applied Scanning Probe Methods VI: Characterization (NanoScience and Technol...

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Release Year: 2006

Book Title: Applied Scanning Probe Methods VI: Characterization (NanoScien...

Number of Pages: Xlv, 338 Pages

Publication Name: Applied Scanning Probe Methods VI : Characterization

Language: English

Publisher: Springer Berlin / Heidelberg

Subject: Nanoscience, Materials Science / Thin Films, Surfaces & Interfaces, Electron Microscopes & Microscopy, Nanotechnology & Mems, Microscopes & Microscopy

Publication Year: 2006

Type: Textbook

Item Weight: 26.3 Oz

Item Length: 9.3 in

Subject Area: Technology & Engineering, Science

Author: Harald Fuchs

Item Width: 6.1 in

Series: Nanoscience and Technology Ser.

Format: Hardcover

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