Description: Credit Rating Migration Risks in Structure Models by Jin Liang, Bei Hu Estimated delivery 3-12 business days Format Hardcover Condition Brand New Description The book is involved various mathematical models, such as PDE, numerical simulation etc., some of them are interesting mathematical problems, so that, and a good reference book to study mathematical modeling in credit rating migration. Publisher Description The book provides the latest research results on measuring Credit Rating Migration by mathematical methods. It brings about most popular mathematical models, methods and applications on this area, especially presents the latest development on structure models. It is systematically collects the models, methods and results in this area.The book first introduced the financial background and preliminary mathematical theory. Then two mainstream mathematical models for measuring default risks, the reduced form model and structure model, are presented. The structure model for measuring credit rating migration risks is the main part of the book and authors prove the existence, uniqueness, regularities, asymptotic behavior, traveling wave and other properties of the solutions of the model. The structural credit rating migration model is also extended to more general case, such as stochastic interest rate, multiple ratings, region switch and so on. Some credit derivatives, and numerical analysis, parameter calibration and estimate of the migration boundary of the models are given in the last two chapters.The book focuses on theoretical financial investigators, especially financial mathematical researchers and students. The book is involved various mathematical models, such as PDE, numerical simulation etc., some of them are interesting mathematical problems, so that, and a good reference book to study mathematical modeling in credit rating migration. It might also be used as a textbook for students in financial credit risks. Author Biography Jin Liang, PhD of Applied Mathematics from Peking University, Professor in School of Mathematical Science, Tongji University. Her research interests focus on applications of PDE, especially on financial mathematics. She published more than 100 academic papers, including pricing financial derivatives, measuring credit risks, financial calculations, carbon reduction controlings etc. She is also a well-known popular science writer in China.Bei Hu, Professor in University of Notre Dame, Department of Applied and Computational Mathematics and Statistics, is an expert in PDE and its applications. He published over 100 papers in a variety of aspects of PDE applications including Blowup Theory, Mathematical Biology, and Mathematical finance. In the past at the University of Notre Dame, he served as a department chair in the Department of Mathematics, department chair in the Department of Applied and Computational Mathematics and Statistics, Associate Dean in the College of Science. He also serves on the editorial board of several journals. Details ISBN 9819721784 ISBN-13 9789819721788 Title Credit Rating Migration Risks in Structure Models Author Jin Liang, Bei Hu Format Hardcover Year 2024 Pages 277 Edition 2024th Publisher Springer Verlag, Singapore GE_Item_ID:161175505; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys
Price: 178.52 USD
Location: Fairfield, Ohio
End Time: 2025-01-07T06:34:13.000Z
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Restocking Fee: No
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ISBN-13: 9789819721788
Book Title: Credit Rating Migration Risks in Structure Models
Number of Pages: IX, 277 Pages
Language: English
Publication Name: Credit Rating Migration Risks in Structure Models
Publisher: Springer
Subject: Finance / General, Applied, Mathematical Analysis
Publication Year: 2024
Type: Textbook
Author: Jin Liang, Bei Hu
Subject Area: Mathematics, Business & Economics
Item Length: 9.3 in
Item Width: 6.1 in
Format: Hardcover