Description: This textbook is a comprehensive guide for anyone interested in learning about the foundations of measurement. It covers topics such as geometrical, threshold, and probabilistic representations, and is authored by Patrick Suppes, Amos Tversky, R. Duncan LUCE, and David H. Krantz. The book is part of the Dover Books ON Mathematics Ser. series and was published in 2006 by Dover Publications, Incorporated. This book is used. Please examine the photos for details on the condition of this book.
Price: 15 USD
Location: Fayetteville, Texas
End Time: 2024-12-14T19:44:39.000Z
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Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 14 Days
Refund will be given as: Money Back
Subject: Books
Item Length: 8.5in.
Item Height: 1.1in.
Item Width: 6.3in.
Author: Patrick Suppes, Amos Tversky, R. Duncan LUCE, David H. Krantz
Publication Name: Foundations of Measurement Vol. II : Geometrical, Threshold, and Probabilistic Representations
Format: Perfect
Language: English
Publisher: Dover Publications, Incorporated
Series: Dover Books ON Mathematics Ser.
Publication Year: 2006
Type: Textbook
Item Weight: 18.1 Oz
Number of Pages: 512 Pages
