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Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 14 Days
Refund will be given as: Money Back
Number of Pages: 524 Pages
Publication Name: Defect Recognition and Image Processing in Semiconductors 1997 : Proceedings of the Seventh Conference on Defect Recognition and Image Processing, Berlin, September 1997
Language: English
Publisher: CRC Press LLC
Subject: Physics / Condensed Matter, Image Processing, Electronics / Semiconductors, Electronics / General, Imaging Systems
Publication Year: 1998
Item Height: 1.1 in
Item Weight: 34.5 Oz
Type: Textbook
Author: J. Doneker, I. Rechenberg
Item Length: 9.4 in
Subject Area: Computers, Technology & Engineering, Science
Series: Institute of Physics Conference Ser.
Item Width: 6.3 in
Format: Hardcover
