Description: Journey to Data Quality ISBN : 9780262513357 Title : Journey to Data Quality Authors : Binding : paperback Publisher : Mit Pr Publication Date : Condition : Ships in a BOX from Central Missouri! May not include working access code. Will not include dust jacket. Has used sticker(s) and some writing and/or highlighting. UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes). Payment We accept PayPal for all eBay orders. Please see payment details below. We will only ship to the address that is entered into PayPal when payment is made! Shipping Multiple shipping options are available for this item. For more detail, please see below, and select the shipping option that is most convenient for you. Returns We have a No Returns policy, which allows us to keep our prices low. Please remember, all purchases are covered by the eBay Money Back Guarantee!
Price: 9.33 USD
Location: Columbia, Missouri
End Time: 2024-11-26T10:21:23.000Z
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Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Book Title: Journey to Data Quality
Number of Pages: 240 Pages
Language: English
Publication Name: Journey to Data Quality
Publisher: MIT Press
Publication Year: 2009
Subject: Data Modeling & Design, Industrial Management, Databases / General, Enterprise Applications / General, Information Technology
Item Height: 0.5 in
Type: Textbook
Item Weight: 11 Oz
Item Length: 8.9 in
Author: James D. Funk, Leo L. Pipino, Y. Lee, Yang W. Lee, Richard Y. Wang
Subject Area: Computers, Business & Economics
Item Width: 6.3 in
Format: Trade Paperback
