Description: Marhoefer Roberts presents ...Journey to Data Quality (The MIT Press) ISBN:0262513358 Author:Lee, Yang W., Pipino, Leo L., Wang, Richard Y., Funk, James Publisher:The MIT Press Release Date:8/21/2009 Seller Category:1 Qty Available:8 Condition:Used: Excellent Sku: PB-MIT-LN-0262513358Notes: LIKE NEW!!! Has a red or black remainder mark on bottom/exterior edge of pages.Don't forget to check out other great deals in our eBay Store!!
Price: 5.96 USD
Location: Mckeesport, PA
End Time: 2024-07-27T01:17:11.000Z
Shipping Cost: 0 USD
Product Images
Item Specifics
Return shipping will be paid by: Seller
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Return policy details:
Artist: Lee, Yang W., Pipino, Leo L., Wang, Richard Y., Funk, James
Number of Pages: 240 Pages
Language: English
Publication Name: Journey to Data Quality
Publisher: MIT Press
Publication Year: 2009
Subject: Data Modeling & Design, Industrial Management, Databases / General, Enterprise Applications / General, Information Technology
Item Height: 0.5 in
Type: Textbook
Item Weight: 11 Oz
Subject Area: Computers, Business & Economics
Author: James D. Funk, Leo L. Pipino, Y. Lee, Yang W. Lee, Richard Y. Wang
Item Length: 8.9 in
Item Width: 6.3 in
Format: Trade Paperback