Description: Please refer to the section BELOW (and NOT ABOVE) this line for the product details - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - Title:Scanning Electron MicroscopyISBN13:9781632384065ISBN10:163238406XAuthor:Page, Lisa (Editor)Description:Fine Focused Electron And Ion Beams Constitute(S) An Inevitable Part Of Methods And Instruments Employed In Various Science Fields Sems Are Well Instrumented And Supplemented With Advanced Techniques And Methods And Thereby Present Endless Possibilities In The Areas Of Quantitative Measurement Of Object Topologies, Surface Imaging, Performing Elemental Analysis And Local Electrophysical Characteristics Of Semiconductor Structures Creation Of Micro And Nanostructures Involves Extensive Use Of Fine Focused E-Beam This Book Focuses On Various Issues Concerned With Scanning Electron Microscopy, Covering Both Theoretical And Practical Aspects Numerous Topics Are Organized Under Two Sections, Material Science And Nanostructured Materials For Electronic Industry This Book Includes Contributions By Renowned Researchers And Experts In This Field Binding:Hardcover, HardcoverPublisher:NY RESEARCH PRPublication Date:2015-03-17Weight:1.23 lbsDimensions:0.69'' H x 9'' L x 6'' WNumber of Pages:292Language:English
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Item Weight: 1.23 lbs
Book Title: Scanning Electron Microscopy
Item Length: 9in.
Item Height: 0.7in.
Item Width: 6in.
Author: Lisa Page
Format: Hardcover
Language: English
Topic: Electron Microscopes & Microscopy
Publisher: NY Research Press
Publication Year: 2015
Genre: Science
Number of Pages: 292 Pages
