Description: Scanning Electron Microscopy : Physics of Image Formation and Microanalysis, Paperback by Reimer, Ludwig, ISBN 3642083722, ISBN-13 9783642083723, Like New Used, Free shipping in the US Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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Book Title: Scanning Electron Microscopy : Physics of Image Formation and Mic
Number of Pages: Xiv, 529 Pages
Language: English
Publication Name: Scanning Electron Microscopy : Physics of Image Formation and Microanalysis
Publisher: Springer Berlin / Heidelberg
Subject: Physics / Condensed Matter, Spectroscopy & Spectrum Analysis, Electron Microscopes & Microscopy, Chemistry / Physical & Theoretical
Publication Year: 2010
Type: Textbook
Item Weight: 29.1 Oz
Item Length: 9.3 in
Subject Area: Science
Author: Ludwig Reimer
Series: Springer Series in Optical Sciences Ser.
Item Width: 6.1 in
Format: Trade Paperback
