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Thermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & tested

Description: Thermo Nicolet 6700 Spectrometer Solid Wafer Profiling FT-IR System Up for sale is a nice, used Thermo-Nicolet 6700 FT-IR Solid Wafer Profiling System. The Ni 6700 FT-IR solid wafer profiling system is equipped with a KBr beam splitter (7800 – 350 cm-1) and DTGS detector and comes as a set with four(4) different optional measuring accessories that allows a wide variety of solid material measurements. This Ni 6700 solid wafer profiling system is a powerful tool optimized for the characterization research of transmittance and reflectance properties of solid and silicon wafer samples. Fully tested operational, great working condition. OPTIONS Includes: (*See All Photos ) This Ni 6700 profiling system allows a variety of measurements using a single spectrometer with four(4) optional measuring accessories. #1. Polarizer (Option) for SRA, VAWH Accessory Modules This polarizer fits in SRA and FT-IR sample window. #2. Wafer Specular Reflectance Analyzer (V-N type) with inserts Reflection measurement accessory for Wafer & Glass Sample Manual sample loading Optics optimized for wafer or other solid analysis (Sizes:2,4,5-inches) (Option) Polarizer mount and Polarizer included Accessory Inserts included #3. Variable Angle Wafer Analyzer(“VAWH”) for Transmission Measurements Holder to accommodates wafers: 8”, 6”, 4” and 2” inch dia.; 125 micron to 2 mm thick. Angular Range: 0 - 60º incident angle relative to the normal Removable wafer sample holder Wafer sample holder will be small to a 6” diameter wafer. Larger wafers will extend out of the top of the holder Materials in contact with the wafer: PTFE and PFA Floor mounted for specified spectrometer (NI8 or N11) (Option) A polarizer can be mounted on a sample window #4. SMART SplitPea Diamond ATR Optically thick, hard samples Slightly curved samples / Fibers/ Paint chips Nanoliters of liquids and pastes Droplets of corrosive liquids Combinatorial chemistry beads Micro Sampling ATR SALE Includes: (*See All Photos ) Thermo Nicolet 6700 FT-IR, 7,800 cm-1 to 350 cm-1 (Approx. 1,282nm to 28,571 nm) Wafer Specular Reflectance Analyzer Variable Angle Wafer Analyzer (VAWH, 8”, 6”, 4” and 2”) Ni SMART SplitPea Micro ATR sampling Device Polaization Lens for SRA, VAWH Ni 6700 Standard Sample Holder 6 Inserts, Assorted Dell Optiplex Control Computer(CPU), that contains; Ni 6700 FT-IR Software installed Ni 6700 Operating Manual, PDF Connecting Cables & Purge Tubes Miscellaneous Items Fully tested operational -- a PC monitor shown is excluded in sale (display only) OPTIONS:Buyer's inspection available at our facility. PAYMENT & SHIPPING:Payment for the item is due within 3 days of the auctions ending date. We ship worldwide. Sold as-is. Please message us for details of air-freight estimate and shipping options: crate, freight and insurance.

Price: 28500 USD

Location: Chantilly, Virginia

End Time: 2024-05-05T14:07:49.000Z

Shipping Cost: 950 USD

Product Images

Thermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & testedThermo Nicolet 6700 FT-IR Solid Wafer Profiling System, NICE & tested

Item Specifics

All returns accepted: ReturnsNotAccepted

Brand: Thermo Nicolet

Type: Optical Spectrometer

Unit Type: Unit

Model: Ni 6700 FT-IR Solid Wafer Analyzer

Country/Region of Manufacture: United States

Intended Use/Discipline: Physical Laboratory

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