Description: VLSI Design and Test by S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh Estimated delivery 3-12 business days Format Paperback Condition Brand New Description This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. Publisher Description This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces. Details ISBN 9811359490 ISBN-13 9789811359491 Title VLSI Design and Test Author S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh Format Paperback Year 2019 Pages 722 Edition 1st Publisher Springer Verlag, Singapore GE_Item_ID:143839304; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys
Price: 126.24 USD
Location: Fairfield, Ohio
End Time: 2024-12-01T03:15:24.000Z
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Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
ISBN-13: 9789811359491
Book Title: VLSI Design and Test
Number of Pages: Xviii, 722 Pages
Language: English
Publication Name: VLSI Design and Test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Publisher: Springer
Subject: Hardware / General
Publication Year: 2019
Item Weight: 39.4 Oz
Type: Textbook
Subject Area: Computers
Author: N. B. Balamurugan
Item Length: 9.3 in
Item Width: 6.1 in
Series: Communications in Computer and Information Science Ser.
Format: Trade Paperback
